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Ultrafast Electron-Phonon Coupling at Metal-Dielectric Interface

机译:金属介质接口的超快电子 - 声子耦合

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摘要

Energy transfer from photo-excited electrons in a metal thin film to the dielectric substrate is important for understanding the ultrafast heat transfer process across the two materials. Substantial research has been conducted to investigate heat transfer in a metal-dielectric structure. In this work, a two-temperature model in metal was used to analyze the interface electron and dielectric substrate coupling. An improved temperature and wavelength-dependent Drude-Lorentz model was implemented to interpret the signals obtained in optical measurements. Ultrafast pump-and-probe measurements on Au-Si samples were carried out, where the probe photon energy was chosen to be close to the interband transition threshold of gold to minimize the influence of non-equilibrium electrons on the optical response and maximize the thermal modulation to the optical reflectance. Electron-substrate interface thermal conductance at different pump laser fluences was obtained, and was found to increase with the interface temperature.
机译:金属薄膜中的光激发电子到介电基板的能量转移对于了解两种材料的超快传热过程非常重要。已经进行了实质性研究以研究金属介电结构中的传热。在这项工作中,使用金属的两个温度模型来分析界面电子和介电基板耦合。实施了改进的温度和波长依赖性疏鲁菜系模型以解释在光学测量中获得的信号。进行UU-Si样品上的超快泵和探针测量,其中选择探针光子能量接近金的间带式过渡阈值,以最小化非平衡电子对光学响应的​​影响,并最大化热量调制光学反射率。获得不同泵激光流量的电子基板接口热敏,并发现随着界面温度增加。

著录项

  • 来源
    《Heat Transfer Engineering》 |2019年第16期|1211-1219|共9页
  • 作者单位

    Purdue Univ Sch Mech Engn Birck Nanotechnol Ctr W Lafayette IN 47907 USA;

    Purdue Univ Sch Mech Engn Birck Nanotechnol Ctr W Lafayette IN 47907 USA;

    Purdue Univ Sch Mech Engn Birck Nanotechnol Ctr W Lafayette IN 47907 USA;

    Purdue Univ Sch Mech Engn Birck Nanotechnol Ctr W Lafayette IN 47907 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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