机译:在ASIPP导体测试设施中进行首次DC性能测试和CC导体短路样品分析
The Institute of Plasma Physics of Chinese Academy of Sciences, P,O, box 1123, Hefei, Anhui 230031, PR China;
The Institute of Plasma Physics of Chinese Academy of Sciences, P,O, box 1123, Hefei, Anhui 230031, PR China;
The Institute of Plasma Physics of Chinese Academy of Sciences, P,O, box 1123, Hefei, Anhui 230031, PR China;
The Institute of Plasma Physics of Chinese Academy of Sciences, P,O, box 1123, Hefei, Anhui 230031, PR China;
The Institute of Plasma Physics of Chinese Academy of Sciences, P,O, box 1123, Hefei, Anhui 230031, PR China;
The Institute of Plasma Physics of Chinese Academy of Sciences, P,O, box 1123, Hefei, Anhui 230031, PR China;
The Institute of Plasma Physics of Chinese Academy of Sciences, P,O, box 1123, Hefei, Anhui 230031, PR China;
The Institute of Plasma Physics of Chinese Academy of Sciences, P,O, box 1123, Hefei, Anhui 230031, PR China;
The Institute of Plasma Physics of Chinese Academy of Sciences, P,O, box 1123, Hefei, Anhui 230031, PR China;
CC conductor; DC performance test; current sharing temperature;
机译:ITER CC导体短样品测试设施的首个性能
机译:在2005-2006年间,在SULTAN工厂中对两个使用先进Nb3Sn绞合线的标准导体样品进行了测试,在(I,B,T)范围内接近ITER工作条件(BMAX〜12 T,T〜5 K)。每个样本包括两个导体脚
机译:已经准备了两个短长度的样品,并在SULTAN中进行了测试,以对用于ITER的大型导管中导体(CICC)中的高电流密度,先进的Nb3Sn绞线的性能进行基准测试。电缆图案和护套布局均为id
机译:导体性能测试设施背景磁导体压降的分析与计算
机译:英语水平和适应能力对伍德考克-约翰逊认知能力测验的影响,第三版表现:在海地克里奥尔语样本中。
机译:避雷针及其测试
机译:NbTi短样品测试结果的含义和对ITER极场导体插入物(PFCI)的分析