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Degradation of thermal conductivity of the damaged layer of tungsten irradiated by helium-plasma

机译:氦等离子体辐照的钨损伤层的导热系数降低

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Pure tungsten samples were irradiated by helium plasma in the linear plasma device PSI-2 with an ion energy of 40 eV and a flux of 1.1 × 1022 m−2s−1. The irradiation temperature was from 523 K to 773 K and the fluence was from 1.0 × 1025to 1.0 × 1026 m−2. A damaged layer of 10 nm thickness was formed on the sample surface with a destroyed crystalline structure. Helium-bubbles and surface modification in nanoscale were observed. Thermal conductivities of the ultra-thin damaged layers were measured by the transient thermoreflectance technique. Result shows that the thermal conductivity reduced two orders of magnitude compared to the bulk value and decreased with increasing irradiation temperature and fluence. Moreover, the helium-irradiated samples were exposed to ELM-like heat load produced by electron beam on EMS-60. The pulse length was 1 ms and each sample was exposed to 5 pulses. Melting occurred under power density of 1.7 GW m−2. As the thermal conductivity of the damaged layer decreased, the molten bath of the irradiated sample deepened. The degraded thermal conductivity led to a lower melting threshold. The characterization of the thermal conductivity of the damaged layer induced by the plasma irradiation is a promising way to estimate the damage level, as well as the failure threshold, of the plasma facing components.
机译:在线性等离子体装置PSI-2中,用氦等离子体照射纯钨样品,离子能量为40 eV,通量为1.1×1022 m-2s-1。照射温度为523 K至773 K,能量密度为1.0×1025至1.0×1026 m-2。在样品表面上形成厚度为10μnm的损坏层,并具有破坏的晶体结构。观察到氦气泡和纳米级的表面改性。通过瞬态热反射技术测量超薄损坏层的热导率。结果表明,热导率与体积值相比降低了两个数量级,并且随着辐照温度和通量的增加而降低。此外,氦辐照的样品暴露于EMS-60上电子束产生的类似ELM的热负荷。脉冲长度为1μms,每个样品暴露于5个脉冲。在1.7 GW m-2的功率密度下发生熔化。随着受损层的热导率降低,被辐照样品的熔池加深。降低的导热率导致较低的熔化阈值。等离子体辐照引起的受损层导热系数的表征是一种有希望的方法,可用来评估等离子体面对面组件的损伤程度以及失效阈值。

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