Pulse Radar System Testing with an LXI VNA

摘要

S-parameter measurements using a VNA with the pulse profile mode provide an accurate interpretation of component performance such as that of power amplifier modules in pulse radar systems. Rohde & Schwarz's LXI-compliant ZVA VNA supports the bandwidth and high sampling rate needed to perform extremely fast pulse profile measurements. Since the ZVA is LAN enabled, it simplifies interconnecting devices and instrument setup and makes data transfer time to the PC negligible.