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首页> 外文期刊>Euphytica >Molecular mapping of quantitative trait loci determining resistance to septoria tritici blotch caused by Mycosphaerella graminicola in wheat
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Molecular mapping of quantitative trait loci determining resistance to septoria tritici blotch caused by Mycosphaerella graminicola in wheat

机译:定量性状基因座的分子作图确定小麦对小麦细小支球菌引起的小麦黑斑病的抗性

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摘要

A set of 65 recombinant inbred lines of the ‘International Triticeae Mapping Initiative’ mapping population (‘W7984’בOpata 85’) was analysed for resistance to septoria tritici blotch at the seedling and adult plant stages. The mapping population was inoculated with two Argentinean isolates (IPO 92067 and IPO 93014). At the seedling stage, three loci were discovered on the short arms of chromosomes 1D, 2D and 6B. All three loci were detected with both isolates. At the adult plant stage, two isolate-specific QTL were found. The loci specific for isolates IPO 92067 and IPO 93014 were mapped on the long arms of chromosomes 3D and 7B, respectively.
机译:分析了“国际黑麦制图计划”制图种群(“ W7984”ד Opata 85”)的65个重组近交自交系在苗期和成株期对小麦黑斑病的抗性。测绘人群接种了两个阿根廷分离株(IPO 92067和IPO 93014)。在苗期,在染色体1D,2D和6B的短臂上发现了三个基因座。两种分离物均检测到所有三个基因座。在成年植物阶段,发现了两个分离株特异性QTL。分离株IPO 92067和IPO 93014的特异位点分别位于3D和7B号染色体的长臂上。

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