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Rigorous analysis of the higher order modes, impedance and attenuation factor of coupled striplines

机译:严格分析耦合带状线的高阶模,阻抗和衰减因子

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摘要

The paper presents a rigorous and computationally efficient analysis of coupled striplines of arbitrary dimensions based on the transverse resonance diffraction (TRD) technique. The calculated higher order mode cutoff frequencies, impedance, coupling factors and attenuation factor are shown to give improved accuracy over a wide range of dimensions when compared with purely analytical and numerical approaches. The TRD results are also in excellent agreement with measured values for the higher order mode cutoff frequencies. The design parameters can be computed in a fraction of the time required for numerical based techniques such as finite elements.
机译:本文基于横向共振衍射(TRD)技术,对任意尺寸的耦合带状线进行了严格而有效的分析。与纯粹的分析和数值方法相比,计算出的高阶模态截止频率,阻抗,耦合因子和衰减因子显示出在较大尺寸范围内均具有更高的精度。 TRD结果也与高阶模式截止频率的测量值非常吻合。设计参数可以在基于数字的技术(例如有限元)中所需的时间的一小部分内进行计算。

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