New Findings Reported from Oak Ridge National Laboratory Describe Advances in Materials Engineering

摘要

2011 OCT 26 - (VerticalNews.com) -- "A new methodology for the measurement of depth sensitive residual stress profiles of thin coatings with sub-micrometer resolution isrnpresented. The two step method consists of incremental focused ion beam (FIB) ring-corernmilling, combined with high-resolution in situ SEM-FEG imaging of the relaxing surface and arnfull field strain analysis by digital image correlation (DIC)," scientists in Oak Ridge, Tennesseernreport.