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Life cycle assessment of high-technology buildings: Energy consumption and associated environmental impacts of wafer fabrication plants

机译:高科技建筑的生命周期评估:晶圆制造厂的能耗和相关的环境影响

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摘要

Effective environmental control and energy efficiency in high-technology buildings have become an important subject of investigations across continents since the last decades. This study aims to quantify energy use and associated environmental impact of four high-technology buildings for wafer fabrication in a subtropical region of Asia using life cycle assessment techniques. Wafer fabrication process and its energy and steam consumption were associated with "summer smog," "heavy metals," and "acidification potential" on the environment. All fabs used natural gas, diesel oil, and steam, which together accounted for about 5% of the total energy consumption. Two metrics - production efficiency index (PEI) and the electricity utilization index (EUI) were used to characterize and normalize environmental impact of each of the four high-technology buildings within which dynamic random access memory (DRAM) wafers were manufactured. The GHG emissions in PEI and EUI have declined from 601 g to 367 g (by 39%) and from 28.9 g to 13.7 g (by 53%), respectively, between 1999 and 2007. Energy intensity per unit area of wafer production has increased from 195 to 268 associated with a 37% increase in emission rate of CO_2-equivalent greenhouse gas (GHG) from 195 kg to 268 kg (by 73 kg) per unit area of wafers produced.
机译:自从过去的几十年以来,对高科技建筑物进行有效的环境控制和能源效率已经成为各大洲研究的重要课题。这项研究旨在使用生命周期评估技术来量化亚洲亚热带地区用于晶圆制造的四座高科技建筑的能源使用和相关的环境影响。晶圆制造过程及其能量和蒸汽消耗与环境中的“夏季烟雾”,“重金属”和“酸化潜力”相关。所有工厂都使用天然气,柴油和蒸汽,它们合计占总能耗的5%。使用两个指标-生产效率指数(PEI)和电力利用率指数(EUI)来表征和标准化制造动态随机存取存储器(DRAM)晶片的四个高科技建筑物中每一个的环境影响。在1999年至2007年之间,PEI和EUI的温室气体排放量分别从601 g降至367 g(下降39%)和从28.9 g降至13.7 g(下降53%)。晶片生产单位面积的能源强度有所提高从195增至268,与每单位生产的晶片的二氧化碳当量温室气体(GHG)的排放率从195千克增加到268千克(73千克)相关的37%。

著录项

  • 来源
    《Energy and Buildings》 |2013年第1期|126-133|共8页
  • 作者单位

    Department of Energy and Refrigerating Air-conditioning Engineering, National Taipei University of Technology, Taiwan, ROC;

    Department of Energy and Refrigerating Air-conditioning Engineering, National Taipei University of Technology, Taiwan, ROC;

    Department of Energy and Refrigerating Air-conditioning Engineering, National Taipei University of Technology, Taiwan, ROC;

    International Energy Studies Group, Environmental Energy Technologies Division, Lawrence Berkeley National Laboratory, CA, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    high-technology buildings; life cycle assessment; wafer fabrication; DRAM; environmental impact; energy use;

    机译:高科技建筑;生命周期评估;晶圆制造;DRAM;对环境造成的影响;能源消耗;

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