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Application of linearly independent arithmetic transform in testing of digital circuits

机译:线性独立算术变换在数字电路测试中的应用

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摘要

Recently introduced linearly independent arithmetic (LIA) transforms and their corresponding spectral coefficients are used to detect faults in digital circuits. The results show that for many classes of logical functions, the LIA logic transformations are advantageous in terms of the number of their coefficients that have to be checked to identify the faults when compared to the case of the well-known arithmetic transform.
机译:最近引入的线性独立算术(LIA)变换及其对应的频谱系数用于检测数字电路中的故障。结果表明,对于许多类的逻辑函数,与众所周知的算术变换相比,LIA逻辑变换在必须检查以识别故障的系数数量方面是有利的。

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