Measurement system captures flicker noise accurately

摘要

Certified to provide accurate measurements from 1 Hz to 30 MHz, the EDGE flicker noise measurement system is a fully integrated turn-key solution, unlike traditional flicker noise measurement solutions, which are belted together from multiple systems and often introduce such noise into measurements. The ability to accurately characterize the flicker, or 1/f, noise-which occurs in all semiconductors and can cause errors in communications devices, flash memory, and SRAM - is key to shrinking operating voltages and device geometries.