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首页> 外文期刊>Electronic Engineering Times >Manufacturing, test to designers: We need to talk: Semicon West speakerrs call for dialogue on key issues
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Manufacturing, test to designers: We need to talk: Semicon West speakerrs call for dialogue on key issues

机译:制造,对设计师的测试:我们需要交谈:Semicon West演讲者呼吁就关键问题进行对话

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摘要

San Francisco - Experts from across the IC production and test industries, from mask makers to developers of automated test equipment, punctuated the Semicon West conference here last week with calls for a new dialogue with IC design teams. The traditional interfaces among design, manufacturing and test are rupturing under the pressure of increasing complexity, these voices warned, and the industry is rapidly approaching a time when only cooperation across those formidable boundaries will get a chip into production. Today the industry relies on formalized interfaces among design, mask making, production and test. For example a GDS-2 tape communicates the design to the mask shop. A set of design rules communicates the process requirements to the design team.
机译:旧金山-来自IC制造和测试行业的专家,从掩模制造商到自动化测试设备的开发人员,在上周于此处举行的Semicon West会议上发表了讲话,呼吁与IC设计团队进行新的对话。这些声音警告说,设计,制造和测试之间的传统接口在不断增加的压力下破裂,并且该行业正迅速接近只有跨越那些强大边界的合作才能使芯片投入生产的时代。如今,该行业依赖于设计,掩模制造,生产和测试之间的正式接口。例如,GDS-2胶带将设计传达给面罩车间。一组设计规则将流程要求传达给设计团队。

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