首页> 外文期刊>Electron Technology >INVESTIGATIONS OF ELECTRONIC STRUCTURE OF TOPOLOGICAL DEFECTS IN CARBON NANOTUBES BY SCANNING TUNNELING MICROSCOPY AND CURRENT IMAGING TUNNELING SPECTROSCOPY
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INVESTIGATIONS OF ELECTRONIC STRUCTURE OF TOPOLOGICAL DEFECTS IN CARBON NANOTUBES BY SCANNING TUNNELING MICROSCOPY AND CURRENT IMAGING TUNNELING SPECTROSCOPY

机译:扫描隧道显微镜和电流成像隧道光谱法研究碳纳米管中的拓扑缺陷的电子结构

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摘要

Scanning tunneling microscopy and current imaging tunneling spectroscopy are used to study electronic structure of the five and seven membered fused disclination centers located at the end of the carbon nanotube. Our results show two resonant states at 1.3 cV below and 1.3 eV above the Fermi level. Furthermore the presence of the metallic-semiconductor transition at the end of the carbon nanotube is confirmed.
机译:扫描隧道显微镜和电流成像隧道光谱用于研究位于碳纳米管末端的五元和七元融合旋错中心的电子结构。我们的结果表明,在费米能级以下1.3 cV和1.3 eV以上的两个共振态。此外,证实了在碳纳米管末端存在金属-半导体过渡。

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