Ion-Implanted TiN Metal Gate With Dual Band-Edge Work Function and Excellent Reliability for Advanced CMOS Device Applications

摘要

This paper proposed, for the first time, that the dual band-edge effective work functions are achieved by employing a single metal gate (MG) and single high- (HK) dielectric via ion implantation into a TiN MG for HP CMOS device applications under a gate-last process flow. The P/BF ion-implanted TiN/HfO/ILSiO gate-stack does not degrade the gate leakage, reliability, and carrier mobility, and reduces the effective oxide thickness. The impact of P/BF ion implant energy, dose, and TiN gate thickness on the properties of implanted TiN/HfO/ILSiO gate-stack is studied, and the corresponding possible mechanisms are discussed. This technique has been successfully applied to the replacement MG and HK/MG last process flow to fabricate HP CMOSFETs and CMOS 32 frequency dividers with a minimum gate length of 25 nm.