...
首页> 外文期刊>IEEE Electron Device Letters >Over 12000 A/cm2 and 3.2 m Ω cm2 Miniaturized Vertical-Type Two-Dimensional Hole Gas Diamond MOSFET
【24h】

Over 12000 A/cm2 and 3.2 m Ω cm2 Miniaturized Vertical-Type Two-Dimensional Hole Gas Diamond MOSFET

机译:超过12000 A / cm2和3.2mΩcm2小型化垂直型二维空气钻石MOSFET

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

We present a miniaturized vertical-type two-dimensional hole gas (2DHG) diamond metal-oxide-semiconductor field-effect transistor (MOSFET) by adopting a gate-source overlapping structure. We developed a 2-mu m-wide trench and disposed a part of the gate electrode to overlap the Al2O3 insulator film on the source electrode to eliminate the space between source and gate electrode. We obtained the maximum drain current density of I-D = 12800 A/cm(2) at V-DS = -50 V and the specific on-resistance of R-ON = 3.2 mcm(2) at V-DS = -10 V and confirmed their improvement by the miniaturization of devices and reduction of source to gate resistance. In addition, the drain current on/off ratio was 7 orders magnitude even at 200 degrees C with the formation of a highly concentrated, thick nitrogen-doped layer as the current blocking layer.
机译:我们通过采用栅极源极重叠结构呈现小型化的垂直型二维空穴气体(2DHG)金刚石金属氧化物半导体场效应晶体管(MOSFET)。我们开发了2-mu m宽的沟槽并设置了栅电极的一部分,以在源电极上重叠,以消除源极和栅电极之间的空间。在V-DS = -50V的V-DS = -50V中获得ID = 12800A / cm(2)的最大漏极电流密度,并且在V-DS = -10V的R-ON = 3.2MCM(2)的特定导通电阻通过器件的小型化和源代码的降低来证实了改善。另外,即使在200摄氏度为200摄氏度,漏极电流ON / OFF比率也为7个阶数为70℃。

著录项

  • 来源
    《IEEE Electron Device Letters》 |2020年第1期|111-114|共4页
  • 作者单位

    Waseda Univ Fac Sci & Engn Tokyo 1698555 Japan;

    Waseda Univ Fac Sci & Engn Tokyo 1698555 Japan;

    Waseda Univ Fac Sci & Engn Tokyo 1698555 Japan;

    Waseda Univ Fac Sci & Engn Tokyo 1698555 Japan;

    Waseda Univ Fac Sci & Engn Tokyo 1698555 Japan;

    Waseda Univ Fac Sci & Engn Tokyo 1698555 Japan;

    Waseda Univ Fac Sci & Engn Tokyo 1698555 Japan;

    Nagoya Univ Inst Mat & Syst Sustainabil Tokyo Branch Tokyo 4648601 Japan|Waseda Univ Res Org Nano & Life Innovat Tokyo 1620041 Japan;

    Waseda Univ Fac Sci & Engn Tokyo 1698555 Japan|Waseda Univ Res Org Nano & Life Innovat Tokyo 1620041 Japan|Waseda Univ Kagami Mem Lab Mat Sci & Technol Tokyo 1690051 Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Diamond; MOSFET; vertical-type device;

    机译:钻石;MOSFET;垂直式设备;

相似文献

  • 外文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号