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首页> 外文期刊>IEEE Transactions on Electromagnetic Compatibility >Coupling Analysis of Complex-Layout Traces Using a Circuit-Concept Approach
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Coupling Analysis of Complex-Layout Traces Using a Circuit-Concept Approach

机译:使用电路概念方法的复杂布局走线的耦合分析

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摘要

An analytical method is studied for estimating coupling between arbitrarily directed multiple finite-length lines with different line lengths and heights. Coupling or crosstalk analysis is performed by developing an expanded circuit-concept approach based on modified telegrapher’s equations of the Agrawal approach instead of the Taylor approach, providing some computational advantages. An electric image method using the quasi-static terms of the accurate Green’s function is used to estimate the electromagnetic fields in an inhomogeneous medium such as a printed circuit board. The approach is applied to the analysis of parallel and nonparallel or bent microstrip models, and embedded-line models in which one line is embedded and the other is on the surface layer. To verify the proposed approach, we conducted some experiments and compared the results of our approach with the results of measurements and a commercial electromagnetic solver.
机译:研究了一种分析方法,用于估计不同长度和高度的任意定向多条有限长度线之间的耦合。耦合或串扰分析是通过基于修改后的电报程序的Agrawal方法而不是Taylor方法开发出一种扩展的电路概念方法来进行的,从而提供了一些计算优势。使用精确格林函数的准静态项的电子成像方法用于估计非均质介质(如印刷电路板)中的电磁场。该方法适用于分析平行和不平行或弯曲的微带线模型,以及其中一条线嵌入而另一条线位于表面层的嵌入线模型。为了验证所提出的方法,我们进行了一些实验,并将我们的方法的结果与测量结果和商用电磁求解器进行了比较。

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