ProPlus 1/f noise system integrates dynamic signal analyzer

摘要

The NoiseProPlus 9812D wafer-level 1/f noise-measurement system delivers accurate measurement up to 10 MHz, while its built-in DSA eliminates the need for external signal-processing equipment. The system measures low-frequency noise characteristics of on-wafer and packaged semiconductor devices, including MOSFETs, BJTs, JFETs, diodes, and diffusion resistors. The 9812D handles up to 100V from the source-measure unit for high-voltage and/or low-current (<0.1 uA) biases. It also employs multiple voltage and current low-noise amplifiers to ensure high measurement accuracy. The 9812D is shipping now; pricing is available upon request.