AFM CHARACTERIZATION OF THE EVOLUTION OF SURFACE DEFORMATION DURING FATIGUE IN POLYCRYSTALLINE COPPER

摘要

Atomic force microscopy(AFM)is a relatively new tool that readily provides high resolution digitized images of surface features. AFM is used here to development of slip bands and protrusions in strain controlled fatigue tests on polycrystalline copper at 0.161 to 0.255/100 strain amplitudes. The average slip band heights at failure for both strain amplitudes conditions are comparable, implying that the growth of slip bands saturates at a specific height.