...
首页> 外文期刊>IEEE Transactions on Dielectrics and Electrical Insulation >Investigation into the eroding dry-band arcing of filled silicone rubber under DC using wavelet-based multiresolution analysis
【24h】

Investigation into the eroding dry-band arcing of filled silicone rubber under DC using wavelet-based multiresolution analysis

机译:基于小波多分辨率分析的直流电充填硅橡胶干带电弧腐蚀研究

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

This paper describes an investigation into the dry-band arcing mechanism leading to erosion of filled silicone rubber in the DC inclined plane test. Good correlation is obtained between the formation of surface residue, hotspots and the eroding dry-band arcing. The hotspots detected by infrared camera correlates well with the temperature of degradation determined by thermogravimetric analysis and differential scanning calorimetry. To characterize the physical mechanism of dry-band arcing, wavelet-based multiresolution analysis up to seven levels of resolution is applied to the leakage current waveforms. The analysis shows that both stable and intense discharges characterize the eroding dry-band arcing. A time-to-eroding parameter is proposed to determine the relative resistance to the formation of residue. Faster accumulation of residue is evident under -DC than +DC. Earlier inception of erosion is obtained for the silica filled- as compared to the alumina tri-hydrate filled- silicone, in which the release of the water of hydration is postulated to suppress the residue formation.
机译:本文介绍了在直流斜面测试中对导致填充硅橡胶腐蚀的干带电弧机理的研究。在表面残留物的形成,热点和侵蚀的干带电弧之间获得了良好的相关性。红外摄像机检测到的热点与通过热重分析和差示扫描量热法确定的降解温度密切相关。为了表征干带电弧的物理机制,对泄漏电流波形应用了基于小波的多分辨率分析,分辨率最高可达到七个级别。分析表明,稳定的放电和强烈的放电都是腐蚀的干带电弧的特征。提出了腐蚀时间参数,以确定对残留物形成的相对抵抗力。在-DC下,残留物的累积速度比+ DC快。与填充三水合氧化铝的硅酮相比,填充硅的二氧化硅获得了更早的侵蚀,其中假定水合水的释放可以抑制残留物的形成。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号