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In situ transmission electron microscopy studies of nanomaterials’ structure-property relationships (review article)

机译:原位透射电子显微镜研究纳米材料结构 - 财产关系(审查文章)

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In situ transmission electron microscopy (TEM)-based experiments have shown to be powerful and reliable waysto study nanomaterials. By combining high-resolution TEM characterization and property measurements on aunique platform, scientists can get deep insights of structure-property relationship at the nanoscale. Moderndedicated TEM holders with precise manipulating capability have opened a new realm of possibilities of whatcan be done under the microscope. This paper aims to highlights the past, present and future of these excitingmethods based on in situ TEM in the last decade. The topics of interest include tensile testing of carbon nanotubes,compression testing of nanostructures, and phase transformations in metallic nanoparticles. The key points of allexperiments discussed are that the measurement data are acquired on an individual nanostructure level underultimately high spatial resolution achievable in TEM, and thus can directly be linked to the dynamic structural andphysical states of a given nanomaterial. The success of these in situ TEM based analysis should clear updiscrepancies in experimental data obtained from indirect measurements of nanomaterials’ properties in literature,and allow engineers to design new devices/products corresponding to the real nanomaterials’ potentials.
机译:原位透射电子显微镜(TEM)基础的实验表明是强大且可靠的WATSTO研究纳米材料。通过将高分辨率的TEM表征和物业测量相结合,科学家可以深入了解纳米级结构性质关系。具有精确操作能力的现代化的TEM持有者已经开辟了在显微镜下完成的新域的可能性。本文旨在突出这些激发方法的过去,当前和未来在过去十年中基于原位。兴趣的主题包括碳纳米管的拉伸测试,纳米结构的压缩检测和金属纳米颗粒中的相变。所讨论的副复合体的关键点是在各自的纳米结构水平上获得测量数据,该纳米结构在TEM中可实现的高空间分辨率,因此可以直接与给定纳米材料的动态结构和物理状态连接。这些原位TEM的分析的成功应清除从文献中的纳米材料属性的间接测量获得的实验数据中的更新,并允许工程师设计与真实纳米材料的潜力相对应的新设备/产品。

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