In this paper, we present a low-profile selective-transmittance resonant structure developed with artificial magnetic conductor (AMC) metamaterials. A planar AMC is used for the two reflectors of the structure. The two reflectors cause no phase shift on reflection at the resonance frequency. The cavity can have zero thickness due to this in-phase reflection. The overall thickness of the structure is only 1.626?mm, which is less than 1/18 of the resonance wavelength. The electromagnetic characteristics of the resonant structure were simulated using simulation software. The simulated maximum transmittance was 0.999 at 9.72?GHz, with the electric field being localized at the interface of the two AMC layers. The measured maximum transmittance was 0.941 at 9.64?GHz. The experimental results are therefore in good agreement with the simulation results. The developed system can excite the interface mode at the resonance frequency and achieve near-perfect transmission of electromagnetic waves.
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