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Compton profile of few-layer graphene investigated by electron energy-loss spectroscopy

机译:通过电子能损光谱研究的几层石墨烯康普顿轮廓

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摘要

In this paper, acquisition of the valence Compton profile of few-layer graphene using electron energy-loss spectroscopy at large scattering angle is reported. The experimental Compton profile is compared with the corresponding theoretical profile, calculated using the full-potential linearized augmented plane wave method based on the local-density approximation. Good agreement exists between the theoretical calculation and experiment. The graphene profile indicates a substantially greater delocalization of the ground state charge density compared to that of graphite.
机译:本文报道,报道了在大散射角度下使用电子能损光谱法获取几层石墨烯的价值康柏曲线。将实验康普顿轮廓与相应的理论轮廓进行比较,使用基于局部密度近似的全电位线性化增大平面波方法计算。在理论计算和实验之间存在良好的一致性。与石墨相比,石墨烯曲线表示与石墨相比的基本电荷密度的基本更大的临床化。

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