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Rapid and facile method to prepare oxide precursor solution by using sonochemistry technology for WZTO thin film transistors

机译:通过对WZTO薄膜晶体管使用SONOCHEMINTY技术制备氧化物前体溶液的快速和容易的方法

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摘要

In this paper, a rapid and facile method of preparing metal-oxide semiconductor precursor solution using sonochemistry technology is proposed. Compared with the traditional method (water bath above 60 °C for several hours), the efficiency of preparing solution is improved, because sonochemical reaction is found to accelerate the dissolution of solutes and the agitation of solution. The color comparison and thermal gravimetric and differential scanning calorimetry of solution confirme the formation of W-doped zinc tin oxide (WZTO) precursor solution with good performance. The effects of sonochemical reactions on the film structure, surface morphology, optical properties and chemical composition of WZTO thin films are analyzed by atomic force microscopy, X-ray diffraction, UV visible spectrum and X-ray photoelectron spectroscopy. The results show that the film has a smooth surface, an amorphous structure, a high transmittance and more M–O bonding. Hence, a rapid process of preparing WZTO solution (sonochemical treatment for 10 min) and fabricate TFT with high electron mobility (2.7 cm ~(2) V ~(?1) s ~(?1) ) is established, while the corresponding mobility of the traditional method is 1.2 cm ~(2) V ~(?1) s ~(?1) . The results show that the sonochemical reaction can improve the efficiency of preparing solution by 1800% and it is a fast and efficient method for preparing precursor solutions.
机译:在本文中,提出了一种使用SONOCHEMINTY技术制备金属氧化物半导体前体溶液的快速和容易的方法。与传统方法(水浴超过60℃以上的水浴)相比,改善了制备溶液的效率,因为发现了多种子胞化学反应加速溶解的溶解和溶液的搅拌。溶液的颜色比较和热重定量和差示扫描量热法证明了具有良好性能W掺杂锌氧化锌(WZTO)前体溶液的形成。通过原子力显微镜,X射线衍射,UV可见光谱和X射线光电子谱分析了Sonochemical反应对WZTO薄膜的膜结构,表面形态,光学性质和化学组成的影响。结果表明,薄膜具有光滑的表面,无定形结构,高透射率和更多M-O键合。因此,在建立具有高电子迁移率的WZTO溶液(SONOCHEMICAL治疗10分钟)和制造TFT的快速过程(2.7cm〜(2)V〜(α1)S〜(α1)),而相应的流动性传统方法是1.2厘米〜(2)V〜(?1)S〜(?1)。结果表明,经过多种化素的反应可以提高1800%的制备溶液的效率,并且是制备前体溶液的快速有效的方法。

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