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首页> 外文期刊>RSC Advances >Structures and characteristics of atomically thin ZrO2 from monolayer to bilayer and two-dimensional ZrO2–MoS2 heterojunction
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Structures and characteristics of atomically thin ZrO2 from monolayer to bilayer and two-dimensional ZrO2–MoS2 heterojunction

机译:从单层到双层和二维ZrO2-MOS2异质结的原子薄ZrO2的结构和特征

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The understanding of the structural stability and properties of dielectric materials at the ultrathin level is becoming increasingly important as the size of microelectronic devices decreases. The structures and properties of ultrathin ZrO _(2) (monolayer and bilayer) have been investigated by ab initio calculations. The calculation of enthalpies of formation and phonon dispersion demonstrates the stability of both monolayer and bilayer ZrO _(2) adopting a honeycomb-like structure similar to 1T-MoS _(2) . Moreover, the 1T-ZrO _(2) monolayer or bilayer may be fabricated by the cleavage from the (111) facet of non-layered cubic ZrO _(2) . Moreover, the contraction of in-plane lattice constants in monolayer and bilayer ZrO _(2) as compared to the corresponding slab in cubic ZrO _(2) is consistent with the reported experimental observation. The electronic band gaps calculated from the GW method show that both the monolayer and bilayer ZrO _(2) have large band gaps, reaching 7.51 and 6.82 eV, respectively, which are larger than those of all the bulk phases of ZrO _(2) . The static dielectric constants of both monolayer ZrO _(2) ( ε _(‖) = 33.34, ε _(⊥) = 5.58) and bilayer ZrO _(2) ( ε _(‖) = 33.86, ε _(⊥) = 8.93) are larger than those of monolayer h-BN ( ε _(‖) = 6.82, ε _(⊥) = 3.29) and a strong correlation between the out-of-plane dielectric constant and the layer thickness in ultrathin ZrO _(2) can be observed. Hence, 1T-ZrO _(2) is a promising candidate in 2D FETs and heterojunctions due to the high dielectric constant, good thermodynamic stability, and large band gap for applications. The interfacial properties and band edge offset of the ZrO _(2) –MoS _(2) heterojunction are investigated herein, and we show that the electronic states near the VBM and CBM are dominated by the contributions from monolayer MoS _(2) , and the interface with monolayer ZrO _(2) will significantly decrease the band gap of the monolayer MoS _(2) .
机译:由于微电子器件的尺寸减小,对超薄水平的结构稳定性和介电材料的结构稳定性和性质变得越来越重要。通过AB Initio计算研究了超薄ZrO _(2)(单层和双层)的结构和性质。形成的形成和声子分散焓的计算证明单层和双层ZrO _(2)的稳定性采用类似于1T-MOS _(2)的蜂窝状结构。此外,1t-ZrO _(2)单层或双层可以通过非层叠立方ZrO _(2)的(111)刻面的切割来制造。此外,与立方Zro _(2)的相应板相比,单层和双层ZrO _(2)中的平面内晶格常数的收缩与报告的实验观察一致。从GW方法计算的电子频带间隙表明单层和双层ZrO _(2)分别具有大的带间隙,分别达到7.51和6.82eV,其大于Zro _(2)的所有散装相的阵列。单层ZrO _(2)的静态介电常数(ε_(ε)= 33.34,ε_(⊥)= 5.58)和双层Zro _(2)(ε_(‖)= 33.86,ε_(⊥) = 8.93)大于单层H-BN(ε_(‖)= 6.82,ε_(⊥)= 3.29),并且在超薄Zro _中平面外介电常数和层厚度之间的强相关性(2)可以观察到。因此,1T-ZrO _(2)是由于高介电常数,良好的热力学稳定性和应用的大带隙而导致的2D FET和异质功能中的有希望的候选者。本文研究了ZrO _(2)-MOS _(2)异质结的界面性质和带边缘偏移,并且我们表明VBM和CBM附近的电子国家由单层MOS _(2)的贡献为主,和单层ZrO _(2)的界面将显着降低单层MOS _(2)的带隙。

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