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Research on Fault Tolerance Enhancement of Array Erasure Codes

机译:阵列擦除码的容错增强研究

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Array erasure coding technology is one of the most desirable methods to enhance the reliability of storage systems, but fault tolerance is always the bottleneck to the use of array codes. There are several improvement schemes for fault tolerance of array codes now, such as graph theory method, hybrid layout method, and so on. But improvement of the fault tolerance is pretty small, and always cost too much. In view of this, the paper presents a new method to improve fault tolerant ability of array erasure codes. The new method has a highly computing efficiency because all calculations are binary XOR operations, and it is convenient to implement because of its simple construction. Using this new method, we can model a horizontal array code with the optimal updating expenses. Although MDS array codes cannot be modeled by the new method, but storage efficiency can be improved by increasing the strip size. The most important contribution of this paper is that, this new method can construct an array erasure code which has the unconstrained fault tolerant ability in theory.
机译:阵列擦除编码技术是增强存储系统可靠性的最理想方法之一,但容错始终是阵列代码的瓶颈。现在有几个有关阵列代码的容错的改进方案,例如图形理论方法,混合布局方法等。但是,容错的改善非常小,并且总是花费太多。鉴于此,本文提出了提高阵列擦除码的容错能力的新方法。新方法具有高计算效率,因为所有计算都是二进制XOR操作,因此由于其施工简单而实现。使用此新方法,我们可以使用最佳更新费用来模拟水平数组代码。尽管MDS阵列代码不能通过新方法建模,但是通过增加条带尺寸可以提高存储效率。本文最重要的贡献是,这种新方法可以构建一个阵列擦除代码,其理论上具有不受约束的容错能力。

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