Grain area data and yield characteristics data in rapid yield prediction based on rice panicle imaging

摘要

To explore the relationship between the attributes of the rice panicle and its weight parameters, 6 different rice cultivars from Sihong City, Jiangsu Province, China were selected for sampling in 2017. Then, their weight parameters were measured. The images of rice panicles were scanned to obtain grain area. The significant correlation between the grain area and the panicle weight was found on the base of the analysis for the data obtained [1]. Now the weight and area data were present here for exploring the rapid yield estimation models and crop phenotype research.