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Obstacle Detector at Head Level

机译:头部障碍物探测器

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In this paper, the design, manufacturing process and testing of a device able to detect obstacles at headlevel is presented. The device’s functionality is based on emission and detection of infrared light andthe tactile stimulus. The design was performed in order to detect objects, from the head and up to 150cm away. The fabrication was done using both an infrared emitter and detector with a 940 nmwavelength; for the signals processing a commercial LM567 Texas Instruments? chip was used. Testswere performed on closed and open spaces, obtaining tactile response with objects placed at 150 cmon closed spaces and placed at 100 cm in open spaces. To further improve the device’s performanceon open spaces an optical filter was used on the phototransistor.
机译:在本文中,提出了能够检测Headlevel障碍物的装置的设计,制造工艺和测试。该器件的功能基于红外光和触觉刺激的排放和检测。设计了设计,以便从头部检测物体,从头到达150厘米。使用具有940 nm波长的红外发射器和检测器进行制造。对于处理商业LM567德州仪器的信号?芯片被使用。 Testswere在闭合空间和打开的空间上执行,获得触觉响应与位于150个CMON封闭空间的物体,并位于打开空间100厘米处。为了进一步改进设备的Performance Open Space,光学滤波器在光电晶体管上使用了光学滤光器。

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