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Structural, Electronic and Magnetic Properties of a Few Nanometer-Thick Superconducting NdBa 2 Cu 3 O 7 Films

机译:少数纳米厚超导NdBa 2 Cu 3 O 7膜的结构,电子和磁性性能

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Epitaxial films of high critical temperature ( T c ) cuprate superconductors preserve their transport properties even when their thickness is reduced to a few nanometers. However, when approaching the single crystalline unit cell (u.c.) of thickness, T c decreases and eventually, superconductivity is lost. Strain originating from the mismatch with the substrate, electronic reconstruction at the interface and alteration of the chemical composition and of doping can be the cause of such changes. Here, we use resonant inelastic x-ray scattering at the Cu L 3 edge to study the crystal field and spin excitations of NdBa 2 Cu 3 O 7 ? x ultrathin films grown on SrTiO 3 , comparing 1, 2 and 80 u.c.-thick samples. We find that even at extremely low thicknesses, the strength of the in-plane superexchange interaction is mostly preserved, with just a slight decrease in the 1 u.c. with respect to the 80 u.c.-thick sample. We also observe spectroscopic signatures for a decrease of the hole-doping at low thickness, consistent with the expansion of the c -axis lattice parameter and oxygen deficiency in the chains of the first unit cell, determined by high-resolution transmission microscopy and x-ray diffraction.
机译:高临界温度的外延薄膜(T C)铜酸铜超导体即使当它们的厚度还原到几纳米时也保持其运输特性。然而,当接近厚度的单晶单元电池(U.C.)时,T C降低并且最终,超导损失。源自与基板的不匹配,界面的电子重建和化学成分和掺杂的改变的应变可以是这种变化的原因。在这里,我们在Cu L 3边缘使用共振非弹性X射线散射,研究NDBA 2 Cu 3 O 7的晶体场和旋转激发。 X在SRTIO 3上生长的超薄薄膜,比较1,2和80 U.c-厚的样品。我们发现即使在极低的厚度下,平面内超速相互作用的强度大多是保存的,只需1个U.即可略有下降。关于80 uc.-厚的样品。我们还观察到光谱签名以降低孔掺杂的低厚度,与第一单元电池链中的C-XIS晶格参数和氧缺陷的膨胀一致,由高分辨率传输显微镜和X-确定射线衍射。

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