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首页> 外文期刊>IEICE Electronics Express >All-digital half-rate referenceless CDR with single direction frequency sweep scheme using asymmetric binary phase detector
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All-digital half-rate referenceless CDR with single direction frequency sweep scheme using asymmetric binary phase detector

机译:全数字半速率由非对称二进制相位检测器具有单向频率扫描方案的All-Digital Alf-rotuel CDR

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This paper presents an all-digital half-rate referenceless CDR with a single direction frequency acquisition achieved. Thanks to asymmetric binary phase detector (ABPD), compared with existed inverse alexander phase detector (IAPD), we changed the input-output characteristic to enable accumulated phase error point in the same direction when frequency error happens while the output of IAPD has no directivity. Once the frequency of the digital controlled oscillator (DCO) enters the pull-in range of the CDR loop, the phase is automatically locked. To improve jitter tolerance (JTOL) performance further, IAPD logic is enabled, and ABPD is disabled after locking. The prototype was implemented in a 28 nm low power CMOS process with a data rate tracking range of 9–11 Gb/s. The measured JTOL is 0.35 UI at high frequency with PRBS31 input data pattern.
机译:本文介绍了一个全数字半速率转印CDR,实现了单个方向频率采集。由于不对称二进制检测器(ABPD),与存在的逆亚历山大探测器(IAPD)相比,我们改变了输入输出特性,以在IAPD的输出没有方向性的同时发生频率误差时使累积相位误差点处于相同方向上。一旦数字受控振荡器(DCO)的频率进入CDR环路的拉入范围,就会自动锁定相位。为了提高抖动公差(JTOL)性能,进一步,EAPD逻辑被启用,锁定后禁用ABPD。原型以28 nm低功耗CMOS过程实现,数据速率跟踪范围为9-11 Gb / s。测量的JTOL以高频为0.35 UI,具有PRBS31输入数据模式。

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