A DGS pattern including DMS behavior for compact unit-cell designs

摘要

In this paper, a new (defected ground structure) DGS unit-cell is introduced and its performance is analyzed. The dumbbell-shaped DGS cell is modified by etching off slots in the ground plane to include (defected microstrip structure) DMS behavior without etching any defect in the microstrip line. The degree of freedom of cell design allows setting the bandgap center frequency while enabling a degree of miniaturization. A circuit-model is proposed to provide accurate cell responses. Simulations of the unit-cell with DGS and DMS behavior show moderate electromagnetic (EM) noise from the ground plane. Advantages are illustrated in a fabricated cell occupying approximately 40% less area.