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首页> 外文期刊>Scientific reports. >Stacking sequence determines Raman intensities of observed interlayer shear modes in 2D layered materials – A general bond polarizability model
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Stacking sequence determines Raman intensities of observed interlayer shear modes in 2D layered materials – A general bond polarizability model

机译:堆叠序列确定2D层状材料中观察到的层间剪切模式的拉曼强度 - 一种通用键极化性模型

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摘要

2D layered materials have recently attracted tremendous interest due to their fascinating properties and potential applications. The interlayer interactions are much weaker than the intralayer bonds, allowing the as-synthesized materials to exhibit different stacking sequences, leading to different physical properties. Here, we show that regardless of the space group of the 2D materials, the Raman frequencies of the interlayer shear modes observed under the typical configuration blue shift for AB stacked materials, and red shift for ABC stacked materials, as the number of layers increases. Our predictions are made using an intuitive bond polarizability model which shows that stacking sequence plays a key role in determining which interlayer shear modes lead to the largest change in polarizability (Raman intensity); the modes with the largest Raman intensity determining the frequency trends. We present direct evidence for these conclusions by studying the Raman modes in few layer graphene, MoS2, MoSe2, WSe2 and Bi2Se3, using both first principles calculations and Raman spectroscopy. This study sheds light on the influence of stacking sequence on the Raman intensities of intrinsic interlayer modes in 2D layered materials in general, and leads to a practical way of identifying the stacking sequence in these materials.
机译:由于其迷人的性能和潜在应用,2D分层材料最近引起了巨大的兴趣。中间层相互作用比腔内键更弱,允许使用的原料表现出不同的堆叠序列,导致不同的物理性质。这里,我们表明,无论2D材料的空间组如何,在典型的配置蓝色移位下观察到的层间剪切模式的拉曼频率,以及ABC堆叠材料的红色移位,随着层数增加。我们的预测是使用直观的键可极化性模型进行的,表明堆叠序列在确定哪种中间剪切模式导致极化性最大变化(拉曼强度)中起着关键作用;具有最大拉曼强度的模式确定频率趋势。我们通过研究少数层石墨烯,MOS 2 ,MOSE 2 ,WSE 2 和BI 2 SE 3 ,使用第一原理计算和拉曼光谱。本研究揭示了堆叠序列对2D层状材料中固有层间模式的拉曼强度的影响,并导致识别这些材料中的堆叠序列的实用方法。

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