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APS -2017 Annual Meeting of the APS Mid-Atlantic Section- Event - Zinc Tungstate Scintillators for Low Energy Electron Microscopy

机译:APS -2017年APS大西洋中部分会年会-活动-钨酸锌闪烁体用于低能电子显微镜

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Zinc tungstate is a crystalline material that emits light as result of electron bombardment. We have deposited ZnWO$_{mathrm{4hinspace }}$films with electrical conductivity enough to prevent charging, photoluminescence quantum efficiency of 23{%}, which are mechanically durable. This makes it a viable thin film coating for scintillators inside an SEM with the added benefit that it can deliver signal even at low energy of the electrons. Our theory is that zinc tungstate as a thin film on top of scintillators offers more benefits for low energy back scattered electron microscopy than ITO or Al, two materials that do not emit light in the presence of electron radiation. We have taken images at low accelerating voltages with two types scintillators, YAP with a thin film of zinc tungstate on top and YAG with ITO. The comparison shows much higher signal to noise ratio for the scintillator with zinc tungstate, and imaging with it at electron energies, where no image can be collected with the scintillator with ITO. The ability of the zinc tungstate film to prevent charging was confirmed with measurement of the electron emission vs. accelerating voltage. These curves are however, very sensitive to the surface properties of the sample.
机译:钨酸锌是一种晶体材料,由于电子轰击而发光。我们已经沉积了具有足够导电性以防止充电的ZnWO $ _ {mathrm {4hinspace}} $薄膜,其机械耐用性为23 {%},光致发光量子效率。这使其成为用于SEM内部闪烁体的可行薄膜涂层,并具有额外的优势,即使在电子能量较低的情况下,它也可以传递信号。我们的理论是,钨酸锌作为闪烁体顶部的薄膜,对低能反向散射电子显微镜而言,比ITO或Al(两种在电子辐射下不会发光的材料)更具优势。我们用两种类型的闪烁体在低加速电压下拍摄了图像:YAP的顶部有钨酸锌薄膜,YAG的是ITO。比较结果表明,钨酸锌闪烁体的信噪比更高,并在电子能量下成像,而使用ITO的闪烁体无法采集图像。通过测量电子发射与加速电压,证实了钨酸锌膜防止充电的能力。但是,这些曲线对样品的表面特性非常敏感。

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