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Na2S-influenced electrochemical migration of tin in a thin electrolyte layer containing chloride ions

机译:Na 2 S影响的锡在含氯离子的薄电解质层中的电化学迁移

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Sodium sulfide was used to prevent the formation of dendrites during the electrochemical migration of tin in chloride-containing thin electrolyte layers. This investigation was based on in situ electrochemical and optical techniques, as well as ex situ characterization. Results show that sodium sulfide can inhibit the electrochemical migration behavior of tin by precipitating tin ions on the anode side, and the inhibition effect strongly depends on concentration. The effects of an applied bias voltage and pH alterations in the system caused by Na2S hydrolysis were also studied. Proposals were made for the mechanisms involved to explain the role of sodium sulfide.
机译:硫化钠用于防止锡在含氯化物的薄电解质层中发生电化学迁移时形成树枝状晶体。该研究基于原位电化学和光学技术以及原位表征。结果表明,硫化钠可通过在阳极侧析出锡离子来抑制锡的电化学迁移行为,且抑制效果很大程度上取决于浓度。还研究了Na 2 S水解引起的施加偏压和体系pH值变化的影响。提出了有关解释硫化钠作用的机制的建议。

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