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Real-time measurements of diffraction grating growth in photopolymer recording materials

机译:实时测量光敏聚合物记录材料中衍射光栅的生长

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摘要

Self-developing ability of photopolymer recording material enables measurements of growth of a refractive index grating in the real-time during a holographic exposure. In our laboratory, we prepare thin layers of photopolymer recording materials and measure their response on harmonic interference field. The results of the measurements are used for characterization of the recording process running in photopolymers and optimization of their chemical composition. Recently, the detection setup has been adapted to measure the phase shift between the recording interference field and the refractive index grating simultaneously with the grow-curves. The phase shift measurement is especially important in the case of photopolymers with nanoparticles as they are spatially redistributed within the layer during the holographic exposure. In the paper, we introduce the principles of the measurement technique, describe our exposure and detection setup, analyze the grow-curve, and show some results obtained from our measurements of the newly developed photopolymer with AgBr nanoparticles.
机译:光聚合物记录材料的自显影能力使得能够在全息曝光期间实时测量折射率光栅的生长。在我们的实验室中,我们准备光敏聚合物记录材料的薄层,并测量它们在谐波干扰场上的响应。测量结果用于表征在光敏聚合物中进行的记录过程并优化其化学组成。近来,检测装置已经适应于与增长曲线同时测量记录干涉场和折射率光栅之间的相移。在具有纳米颗粒的光聚合物的情况下,相移测量尤为重要,因为它们在全息曝光期间会在空间内重新分布在层中。在本文中,我们介绍了测量技术的原理,描述了我们的曝光和检测设置,分析了生长曲线,并显示了从我们对带有AgBr纳米粒子的新开发的光聚合物的测量中获得的一些结果。

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