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Reducing Area & Power Overhead In Design of Light Weight Sensor For Detection of Reclcled ICS

机译:用于检测ICS的轻型传感器设计中的缩小面积和功耗开销

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The counterfeiting and recycling of integrated circuits (ICs) have become major issues in recent years, potentially impacting the security and reliability of electronic systems bound for military, financial, or other critical applications. With identical functionality and packaging, it would be extremely difficult to distinguish recycled ICs from unused ICs. In the existing Ring Oscillator (RO) based sensor with 90nm technology test chip shows the effective detection of recycled ICs. The impact of RO based sensor is that, it is difficult to identify recycled ICs used shorter than one month and it requires more power and area overhead. To provide a solution to the existing system, Clock Anti fuses (CAF) based sensor is implemented to enhance the effective recognition of recycled ICs even if the IC used for a very short period. MAF is implemented in FPGA to verify its effectiveness.
机译:近年来,伪造和回收集成电路(IC)已成为主要问题,可能会影响到军事,金融或其他关键应用领域的电子系统的安全性和可靠性。具有相同的功能和封装,将回收的IC与未使用的IC区别开来将非常困难。在现有的采用90nm技术的基于环形振荡器(RO)的传感器中,测试芯片可有效检测回收的IC。基于RO的传感器的影响在于,很难识别使用时间少于一个月的可回收IC,并且需要更多的功率和面积开销。为了提供对现有系统的解决方案,基于时钟防熔丝(CAF)的传感器被实施以增强对回收IC的有效识别,即使该IC使用时间很短也是如此。 MAF在FPGA中实现,以验证其有效性。

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