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首页> 外文期刊>Bulletin of the Korean Chemical Society >Reactive Ion Scattering of Low Energy Cs+ from Surfaces. A Technique for Surface Molecular Analysis
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Reactive Ion Scattering of Low Energy Cs+ from Surfaces. A Technique for Surface Molecular Analysis

机译:低能Cs + 从表面的反应性离子散射。表面分子分析技术

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Although the currently available surface spectroscopic techniques provide powerful means of studying atoms and simple molecules on surfaces, the identification of complex molecules and functional groups is a major concern in surface analysis. This article describes a recently developed method of surface molecular analysis based on reactive ion scattering (RIS) of low energy ( 100 eV) Cs+ beams. The RIS method can detect surface molecules via a mechanism in which a Cs+ projectile picks up an adsorbate from the surface during the scattering process. The basic principles of the method are reviewed and its applications are discussed by showing several examples from studies of molecules and their reactions on surfaces.
机译:尽管当前可用的表面光谱技术为研究表面上的原子和简单分子提供了强大的手段,但是复杂分子和官能团的识别是表面分析中的主要问题。本文介绍了一种基于低能(<100 eV)Cs +束的反应性离子散射(RIS)的表面分子分析方法。 RIS方法可以通过一种机制来检测表面分子,在散射过程中,Cs +弹丸会从表面拾取被吸附物。通过展示分子研究及其在表面反应的几个例子,回顾了该方法的基本原理并讨论了其应用。

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