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Double Differential Cross-Sections for Electron Impact Ionization of Atoms and Molecules

机译:原子和分子的电子碰撞电离的双微分截面

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The single ionizing collision between an incident electron and an atom/molecule ends up two kinds of outgoing electrons called scattered and ejected electrons. As features of electron impact ionization, these two types of electrons are indistinguishable. Double differential cross-sections (DDCS) can be obtained by measuring the energy and angular distributions of one of the two outgoing electrons with an electron analyzer. We used He, Ar, H2, and CH4targets in order to understand the ionization mechanisms of atomic and molecular systems. We measured differential cross-sections (DCS) and double differential cross-sections at 250 eV electron impact energy. The elastic DCSs were measured for He, Ar, H2, and CH4, whereas the inelastic DCSs of He were obtained for 21P excitation level for 200 eV impact electron energy.
机译:入射电子与原子/分子之间的单次电离碰撞最终导致两种出射电子被称为散射电子和喷射电子。作为电子碰撞电离的特征,这两种电子是无法区分的。通过使用电子分析仪测量两个输出电子之一的能量和角分布,可以获得双微分截面(DDCS)。我们使用He,Ar,H2和CH4靶标来了解原子和分子系统的电离机理。我们在250 eV电子冲击能下测量了微分横截面(DCS)和双微分横截面。测量了He,Ar,H2和CH4的弹性DCS,而对于200 eV冲击电子能量,通过21P激发能级获得了He的非弹性DCS。

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