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Extraction of S-Parameters for a Slot Unit on the Post-Wall Waveguide from Measured Data

机译:从实测数据中提取壁后波导上插槽单元的S参数

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摘要

Post-wall waveguide structures have attracted a great deal of attention for micro- and millimeter-wave applications. One of the waveguide’s applications is a slotted waveguide array. In order to design the slotted array, the characteristics of a slot unit alone on the post-wall waveguide should be investigated. In this paper, a method for extracting the S-parameters of a unit slot is proposed. This simple method requires only two kinds of waveguides: waveguides without a slot unit and waveguides with a slot unit. Three kinds of slot units are fabricated, and the extracted results show a high level of agreement with predicted (simulated) results. With this method, the equivalent slot length can also be found.
机译:壁后波导结构在微波和毫米波应用中引起了极大的关注。波导的应用之一是缝隙波导阵列。为了设计缝隙阵列,应研究壁后波导上单独缝隙单元的特性。在本文中,提出了一种提取单元槽的S参数的方法。这种简单的方法仅需要两种波导:不带缝隙单元的波导和带缝隙单元的波导。制作了三种插槽单元,提取的结果与预测(模拟)结果高度吻合。使用这种方法,也可以找到等效的插槽长度。

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