首页> 外文期刊>Journal of Physics: Conference Series >Design and fabrication of ultrathin silicon-nitride membranes for use in UV-visible airgap-based MEMS optical filters
【24h】

Design and fabrication of ultrathin silicon-nitride membranes for use in UV-visible airgap-based MEMS optical filters

机译:用于紫外可见气隙的MEMS光学滤光片的超薄氮化硅膜的设计和制造

获取原文
           

摘要

MEMS-basedairgapopticalfiltersarecomposedofquarter-wavethickhigh-indexdielectricmembranesthatareseparatedbyairgaps.Themainchallengeinthefabricationofthesefiltersistheintertwinedopticalandmechanicalrequirements.Thethicknessofthelayersdecreaseswithdesignwavelength,whichmakestheopticalperformanceintheUVmoresusceptibletofabricationtolerances,suchasthicknessandcompositionofthedepositedlayers,whiletheabilitytosustainacertainlevelofresidualstressbythestructuralstrengthbecomesmorecritical.Silicon-nitridehasacomparativelyhighYoung'smodulusandgoodopticalproperties,whichmakesitasuitablecandidateasthemembranematerial.However,boththemechanicalandopticalpropertiesinasilicon-nitridefilmstronglydependonthespecificsofthedepositionprocess.Adesigntrade-offisrequiredbetweenthemechanicalstrengthandtheindexofrefraction,bytuningthesiliconcontentinthesilicon-nitridefilm.However,alsothebenefitofahighindexofrefractioninasilicon-richfilmshouldbeweighedagainsttheincreasedUVopticalabsorption.Thisworkpresentsthedesign,fabrication,andpreliminarycharacterizationofoneandthreequarter-wavethicksilicon-nitridemembraneswithaone-quarterairgapanddesignedtogiveaspectralreflectanceat400nm.ThePECVDsilicon-nitridelayerswereinitiallycharacterized,andthedatawasusedfortheopticalandmechanicaldesignoftheairgapfilters.ACMOScompatibleprocessbasedonpolysiliconsacrificiallayerswasusedforthefabricationofthemembranes.Opticalcharacterizationresultsarepresented...
机译:MEMS的basedairgapopticalfiltersarecomposedofquarter-wavethickhigh-indexdielectricmembranesthatareseparatedbyairgaps.Themainchallengeinthefabricationofthesefiltersistheintertwinedopticalandmechanicalrequirements.Thethicknessofthelayersdecreaseswithdesignwavelength,whichmakestheopticalperformanceintheUVmoresusceptibletofabricationtolerances,suchasthicknessandcompositionofthedepositedlayers,whiletheabilitytosustainacertainlevelofresidualstressbythestructuralstrengthbecomesmorecritical.Silicon-nitridehasacomparativelyhighYoung'smodulusandgoodopticalproperties,whichmakesitasuitablecandidateasthemembranematerial.However,boththemechanicalandopticalpropertiesinasilicon-nitridefilmstronglydependonthespecificsofthedepositionprocess.Adesigntrade-offisrequiredbetweenthemechanicalstrengthandtheindexofrefraction,bytuningthesiliconcontentinthesilicon-nitridefilm.However,alsothebenefitofahighindexofrefractioninasilicon-richfilmshouldbeweighedagainsttheincreasedUVopticalabsorption.Thisworkpresentsthedes对具有一个四分之一气隙的四分之一波厚的氮化硅薄膜进行烧制,制备和初步表征,并设计为在400nm处具有光谱反射率。首先对PECVD氮化硅层进行了表征,然后将其用于光学和机械上的数据存储,以便将其用于光学和机械设计上的适用于该工艺的聚碳层用于光学设计。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号