Recrystallization and investigation of bismuth thin films by means of electron beam in transmission electron microscope

摘要

Thin bismuth films obtained by vacuum deposition were recrystallized under electron beam of scanning electron microscope at 5 kV and examined in a transmission electron microscope at 200 kV. In recrystallized films, various microstructures were detected: single-crystal, polycrystalline and amorphous regions, more or less faceted grains, single crystals and untransparent drop-shaped particles. In the crystallized film, a strong internal bending of the crystal lattice is detected, up to 110 deg/μm.