首页> 外文期刊>Journal of Oral Science >Fracture resistance of monolithic and veneered all-ceramic four-unit posterior fixed dental prostheses after artificial aging
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Fracture resistance of monolithic and veneered all-ceramic four-unit posterior fixed dental prostheses after artificial aging

机译:全瓷单板全瓷四单元后固定假体的抗老化性

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This study compared the fracture resistance of monolithic and veneered all-ceramic four-unit posterior fixed dental prostheses (FDPs) generated by computer-aided design/computer-aided manufacturing (CAD/CAM) after aging in a mastication simulator. Four-unit FDPs were designed from six different all-ceramic systems: 1) monolithic lithium disilicate (M-E), 2) monolithic zirconia (M-TZI), 3) veneered zirconia by conventional layering (V-L), 4) veneered zirconia by lithium disilicate pressing (V-P), 5) veneered zirconia by lithium disilicate fusing (CAD-F-E), and 6) veneered zirconia by feldspathic ceramic cementing (CAD-C-CB). The specimens were divided into control and aging groups ( n = 10 per group). The aging process included both thermocycling and mechanical loading and was followed by fracture resistance testing. All specimens in the M-E, M-TZI, and V-L groups survived; however, all specimens in the V-P group were fractured during artificial aging. The highest fracture resistance values were observed in the M-TZI group. According to the fracture resistance test, connector fractures were the most frequent type of failure. M-TZI and M-E FDPs revealed no failures during aging and showed higher fracture resistance than the veneered groups. Among the veneered zirconia framework groups, V-L FDPs showed the highest success rate during aging, while the fracture resistance was similar among all the veneered zirconia groups.
机译:这项研究比较了在咀嚼模拟器中老化后由计算机辅助设计/计算机辅助制造(CAD / CAM)生成的整体式和单板全陶瓷四单元后固定牙修复体(FDP)的抗断裂性。由六种不同的全陶瓷系统设计了四单元FDP:1)整体式二硅酸锂(ME),2)整体式氧化锆(M-TZI),3)通过常规分层(VL)的单板氧化锆,4)锂的单板氧化锆二硅酸钙压制(VP),5)通过二硅酸锂熔合的单板氧化锆(CAD-FE)和6)通过长石性陶瓷胶结的单板氧化锆(CAD-C-CB)。将标本分为对照组和老化组(每组n = 10)。老化过程包括热循环和机械负载,然后进行抗断裂测试。 M-E,M-TZI和V-L组中的所有标本均存活下来。但是,V-P组的所有标本在人工时效过程中均断裂。在M-TZI组中观察到最高的抗断裂强度值。根据抗断裂性测试,连接器断裂是最常见的故障类型。 M-TZI和M-E FDP在老化过程中没有失效,并且比胶合板更高。在单板氧化锆框架组中,V-L FDP在老化过程中显示出最高的成功率,而在所有单板氧化锆组中,抗断裂性相似。

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