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首页> 外文期刊>Journal of Ovonic Research >Comparison effect of spin speeds and substrate layers on properties of doubly doped tin oxide thin films prepared by sol-gel spin coating method
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Comparison effect of spin speeds and substrate layers on properties of doubly doped tin oxide thin films prepared by sol-gel spin coating method

机译:旋转速度和基底层对溶胶-凝胶旋涂法制备的双掺杂氧化锡薄膜性能的比较影响

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摘要

Tin oxide thin films doubly doped with antimony and fluorine (Sb, F) were deposited bysol-gel spin coating method at different spin speeds and substrate layers on glass substrate.Effect of spin speeds and substrate layers on the characterizations of the films wasinvestigated. X-ray diffraction studies revealed that antimony and fluorine have beensuccessfully doped into the SnO2 thin films and all the prepared films were singlecrystalline in nature and exhibited orthorhombic structure with preferential orientation{021} family of planes. As the tin oxide thin films have quite often structure of tetragonalpolycrystalline, this obtained orthorhombic structure is rarely in terms of literature.Although intensity of preferential orientation changed, its orientation did not change withincreasing spin speeds and substrate layers. Also, peak intensity of the films prepared with6 substrate layers was bigger than 5 substrate layers, but crystallinity in 5 substrate layerswas better than 6 substrate layers. Transmittance (90-95%.) values found in this studywere to be much better than previously reported values (50-80%). Together with thesestudies, PLQY value of an inorganic material such as tin oxide which weakly emit wasmeasured. Eventually, the obtained results revealed that properties of the thin films weregreatly affected by spin speeds and substrate layers.
机译:采用溶胶-凝胶旋涂法,在玻璃基板上以不同的旋转速度和衬底层沉积了掺锑和氟(Sb,F)的氧化锡薄膜。研究了旋转速度和衬底层对薄膜特性的影响。 X射线衍射研究表明,锑和氟已成功掺入SnO2薄膜中,所有制备的薄膜本质上都是单晶的,并表现出具有优先取向{021}平面族的正交晶结构。由于氧化锡薄膜通常具有四方多晶的结构,因此从文献角度来看,这种正交晶结构很少见。尽管优先取向的强度发生了变化,但其取向并未随着旋转速度和基底层的增加而改变。同样,用6个基底层制备的膜的峰强度大于5个基底层,但是5个基底层的结晶度优于6个基底层。在这项研究中发现的透射率(90-95%)值比以前报告的值(50-80%)好得多。与这些研究一起,测量了弱发射的诸如氧化锡的无机材料的PLQY值。最终,获得的结果表明,薄膜的性能在很大程度上受旋转速度和基底层的影响。

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