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首页> 外文期刊>Journal of Ovonic Research >further Meyer-Neldel Rule in a-Se70Te30-xZnx
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further Meyer-Neldel Rule in a-Se70Te30-xZnx

机译:-Se 70 Te 30 - x Zn x 中的进一步Meyer-Neldel规则

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摘要

Temperature dependence of conductivity is measured in dark as well as in presence of light in amorphous thin films of Se70Te30-xZnx in the temperature range 290 –365 K and in the intensity range 0-1190 Lux. We have investigated further Meyer Neldel rule by two different approaches. In first approach, the different sets of Meyer Neldel pre-factor ó00 and Meyer Neldel energy Emn are obtained by keeping composition constant. In the second approach, the different sets of Meyer Neldel prefactor ó00 and Meyer Neldel energy Emn are obtained by changing the composition. A strong correlation between Meyer Neldel pre-factor ó00 and Meyer Neldel energy Emn has been observed in both the cases.
机译:在290 – 365 K的温度范围和0-1190 Lux的强度范围内,在Se70Te30-xZnx非晶薄膜中在黑暗和有光的条件下,测量电导率的温度依赖性。我们通过两种不同的方法进一步研究了Meyer Neldel规则。在第一种方法中,通过保持成分恒定,获得了不同的Meyer Neldel预因子00和Meyer Neldel能量Emn。在第二种方法中,通过更改组成可获取不同的Meyer Neldel前置因子00和Meyer Neldel能量Emn。在这两种情况下,均已观察到迈耶·内德尔(Meyer Neldel)因子00与迈耶·内德尔(Meyer Neldel)能量Emn之间的密切关系。

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