Investigation on structural, optical, morphological and electrical properties of lead sulphide (PbS) thin films

摘要

Lead sulphide (PbS) thin films have been deposited on glass slide using the chemical bath dep osition (CBD) technique. X-ray diffraction (XRD) is used to establish the structure and crystallite size of these films. The surface morphology o f the films was investigated by using scanning electron microscopy (SEM) and atomic force microscop y (AFM). The optical properties of the PbS thin films were determined using UV-Visible spectroscopy. Optical constants such as band gap, refractive index, reflectance, extinction coefficient and electric susceptibility were determined from UV-V isible absorption spectrum. The dielectric constant, dielectric loss and ac conductivity of the PbS thin films were studied at different temperatures and frequencies to analyze the electrical properties.