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首页> 外文期刊>Journal of Materials >Dielectric Relaxation and Hopping Conduction in La2NiO4+δ
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Dielectric Relaxation and Hopping Conduction in La2NiO4+δ

机译:La2NiO4 +δ的介电弛豫和跃迁传导

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An ac conductivity as well as dielectric relaxation property of La2NiO4.1is reported in the temperature range of 77 K–130 K and in the frequency range of 20 Hz–1 MHz. Complex impedance plane plots show that the relaxation (conduction) mechanism in this material is purely a bulk effect arising from the semiconductive grain. The relaxation mechanism has been discussed in the frame of electric modulus spectra. The scaling behavior of the modulus suggests that the relaxation mechanism describes the same mechanism at various temperatures. The logarithmic angular frequency dependence of the loss peak is found to obey the Arrhenius law with the activation energy of~0.09 eV. The frequency-dependent electrical data are also analyzed in the frame of ac conductivity formalism. The ac conductivity has been found to follow a power-law behavior at a limited temperature and frequency region where Anderson localization plays a significant role in the transport mechanism for La2NiO4.1.
机译:据报道,La2NiO4.1的交流电导率以及介电弛豫特性在77 K–130 K的温度范围和20 Hz-1 MHz的频率范围内。复杂的阻抗平面图表明,这种材料中的弛豫(传导)机理纯粹是由半导体晶粒引起的整体效应。在电模量谱的框架中已经讨论了弛豫机理。模量的缩放行为表明,松弛机理描述了在不同温度下的相同机理。发现损耗峰的对数角频率依赖性遵循阿雷尼乌斯定律,其激活能为〜0.09 eV。还在交流电导率形式框架内分析了频率相关的电数据。已发现交流电导率在有限的温度和频率区域内遵循幂律行为,其中安德森定位在La2NiO4.1的传输机理中起着重要作用。

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