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首页> 外文期刊>Journal of Materials Research and Technology >Microstructures and mechanical properties of Al-Mg 2Si-Si alloys resistance spot welded with Al-Si interlayers
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Microstructures and mechanical properties of Al-Mg 2Si-Si alloys resistance spot welded with Al-Si interlayers

机译:Al-Mg 2 Si-Si合金点焊Al-Si中间层的组织和力学性能

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This study investigates Al-Mg2Si-Si alloy joints produced via resistance spot welding (RSW) with and without the use of Al-Si interlayers. The joint microstructures produced both with and without Al-Si interlayers consist of three zones: the base material (BM), the heat affected zone (HAZ) and the weld nugget (WN). The WN is oval, and increases in the welding current increase the WN size in both welding methods. The joints produced via RSW with an Al-Si interlayer have larger WNs than those produced without an interlayer under the same welding current conditions. Relationships between the welding current and the WN size are established by Gaussian fitting and Lorentz fitting. A comparison of the two welding approaches shows that a successful weld can be obtained at a low welding current when an Al-Si interlayer is used, whereas a larger welding current is required to obtain the same result without the use of an Al-Si interlayer. The transition layer (interface between the HAZ and the WN) in the joints welded without an interlayer is a single eutectic phase structure; however, in the joints welded with an interlayer, the transition layer generates an equiaxed-columnar crystal zone. The formation of the equiaxed-columnar crystal zone and the change in composition of the WN (according to the results of differential scanning calorimetry tests) improve the tensile-shear loads (TSLs). The equations of the peak TSLs as a function of the welding current and WN size are established by Gaussian fitting.
机译:这项研究调查了通过和不使用Al-Si中间层通过电阻点焊(RSW)制作的Al-Mg2Si-Si合金接头。在有和没有Al-Si夹层的情况下产生的接头微观结构均由三个区域组成:基础材料(BM),热影响区(HAZ)和熔核(WN)。 WN是椭圆形的,在两种焊接方法中,焊接电流的增加都会增加WN的尺寸。在相同的焊接电流条件下,通过RSW与Al-Si中间层形成的接头比没有中间层的接头具有更大的WN。焊接电流和WN尺寸之间的关系是通过高斯拟合和洛伦兹拟合建立的。两种焊接方法的比较表明,当使用Al-Si夹层时,可以在低焊接电流下获得成功的焊接,而在不使用Al-Si夹层的情况下,需要较大的焊接电流才能获得相同的结果。 。在没有中间层的情况下焊接的接头中的过渡层(HAZ和WN之间的界面)是单一的共晶相结构。但是,在焊接有中间层的接头中,过渡层会产生等轴柱状晶体区。等轴柱状晶体区的形成和WN组成的变化(根据差示扫描量热法测试的结果)可改善拉伸剪切载荷(TSL)。通过高斯拟合建立峰值TSL随焊接电流和WN尺寸变化的方程。

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