Probability Density Functions of Voltage Sags Measured Indices

摘要

Probability Density Functions of Voltage Sags Measured Indices Voltage sags can cause interruptions of industrial processes, which could result as a malfunction of equipment and considerable economic losses. Thus, it is very useful to see certain rules of voltage sags occurrence due to duration and depth.This paper presents statistical analyses of voltage sags in several domestic and industrial transformer stations. Voltage sag probability functions are calculated from actual measurement data, by means of a hill climbing algorithm. Lognormal and Weibull frequency distribution functions are used to describe distribution of measured voltage dips.