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Design and Implement of Low Power Consumption SRAM Based on Single Port Sense Amplifier in 65 nm

机译:基于65 nm单端口读出放大器的低功耗SRAM的设计与实现

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With the rapid development of integrated circuits [1], low power consumption has become a constant pursuiting goal of the designer in chip design. As the memory almost takes up the area of the chip, reducing memory power consumption will significantly reduce the overall power consumption of the chip; according to ISSCC’s 2014 report about technology trends discussions, there two points of the super-low power SRAM design: 1) design a more effective static and dynamic power control circuit for each key module of SRAM; 2) ensure that in the case of the very low VDD min, SRAM can operating reliably and stably. This paper makes full use reliable of 8T cell, and the single-port sense amplifier has solved problems in the traditional 8T cell structure, making the new structure of the memory at a greater depth still maintain good performance and lower power consumption. Compared with the designed SRAM the SRAM generated by commercial compiler, as the performance loss at SS corner does not exceed 10%, the whole power consumption could be reduced by 54.2%, which can achieve a very good effect of low-power design.
机译:随着集成电路的快速发展[1],低功耗已成为芯片设计人员不断追求的目标。由于存储器几乎占据了芯片的面积,因此降低存储器功耗将大大降低芯片的总体功耗;根据ISSCC在2014年关于技术趋势讨论的报告,超低功耗SRAM设计有两点:1)为SRAM的每个关键模块设计更有效的静态和动态电源控制电路; 2)确保在VDD min极低的情况下,SRAM能够可靠且稳定地运行。本文充分利用了8T单元的可靠性,单端口读出放大器解决了传统的8T单元结构中的问题,使得新的存储器结构在更大的深度上仍保持了良好的性能和较低的功耗。与设计的SRAM相比,商用编译器生成的SRAM,由于SS拐角处的性能损失不超过10%,可以将整体功耗降低54.2%,可以达到很好的低功耗设计效果。

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