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首页> 外文期刊>Journal of applied sciences research >Synthesis and Characterization of Nano- Structure TiO2 Thin Film Prepared by Sol-Gel Spin Coating Method
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Synthesis and Characterization of Nano- Structure TiO2 Thin Film Prepared by Sol-Gel Spin Coating Method

机译:溶胶-凝胶旋涂法制备纳米结构TiO2薄膜的合成与表征

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摘要

Titanium dioxide thin films have been synthesized by sol-gel spin coating technique on glass substrate. The prepared thin films have been submitted to different annealing temperature ranging from 300 upto 500 oC. The effects of annealing temperatures on the structural and optical properties of thin films were investigated. The films were characterized by different techniques: X-ray diffraction (XRD), UV-visible spectroscopy, scanning electron microscope (SEM) and transmission electron microscopy (TEM). The characterization studies revealed that the films are crystallized into nano-structured anatase phase. The crystallite sizes obtained from XRD annealed at 300, 400 and 500 oC are found to be about 159.34, 76.95 and 17.61 nm respectively. The crystallite size of TiO2 thin films decreased with increasing annealing temperature. The mentioned data were confirmed by TEM, which revealed the presence of TiO2 nano-particle of about (~3-4 nm). The optical measurement showed the direct band gap at 4.27, 4.28 and 4.37 eV for 300, 400 and 500 oC, respectively. The TiO2 thin films have higher transparency in the visible range at 500 oC. SEM image of films annealed showed nano-crystalline structure of TiO2 particles and they are approximately in spherical forms.
机译:已经通过溶胶-凝胶旋涂技术在玻璃基板上合成了二氧化钛薄膜。所制备的薄膜已经经受了300至500 oC的不同退火温度。研究了退火温度对薄膜结构和光学性能的影响。薄膜通过不同的技术表征:X射线衍射(XRD),紫外可见光谱,扫描电子显微镜(SEM)和透射电子显微镜(TEM)。表征研究表明,薄膜结晶为纳米结构的锐钛矿相。从XRD在300、400和500 oC退火得到的微晶尺寸分别约为159.34、76.95和17.61 nm。 TiO 2薄膜的微晶尺寸随着退火温度的升高而减小。 TEM证实了上述数据,结果表明存在约(〜3-4 nm)的TiO2纳米颗粒。光学测量显示300、400和500 oC的直接带隙分别为4.27、4.28和4.37 eV。 TiO2薄膜在500 oC的可见光范围内具有更高的透明度。退火后的薄膜的SEM图像显示了TiO2颗粒的纳米晶体结构,并且它们近似呈球形。

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