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Elastic constants and Debye temperature of wz-AlN and wz-GaN semiconductors under high pressure from first-principles

机译:第一性原理在高压下wz-AlN和wz-GaN半导体的弹性常数和德拜温度

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First-principles calculations were performed to study the elastic stiffness constants ($C_{ij}$) and Debye temperature ($e???_D$) of wurzite (wz) AlN and GaN binary semiconductors at high pressure. The lattice constants were calculated from the optimized structure of these materials. The band gaps were calculated at e??¤ point using local density approximation (LDA) approach. The unit cell volume, lattice parameters, e?‘?/e?‘?, internal parameter (e?‘¢), elastic constant ($C_{ij}$), Debye temperature ($e???_D$), Hubbard parameter (e?‘?) and band gap ($E_g$) were studied under different pressures. The bulk modulus ($B_0$), reduced bulk modulus ($B'_0$) and Poisson ratio ($vee$) were also calculated. The calculated values of these parameters are in fair agreement with the available experimental and reported values.
机译:进行第一性原理计算,以研究高压下纤锌矿(wz)AlN和GaN二元半导体的弹性刚度常数($ C_ {ij} $)和德拜温度($ e ??? _ D $)。由这些材料的优化结构计算出晶格常数。使用局部密度近似(LDA)方法在eΔτ点计算带隙。晶胞体积,晶格参数e?'?/ e?'?、内部参数(e?'¢),弹性常数($ C_ {ij} $),德拜温度($ e ??? _ D $),在不同压力下研究了哈伯德参数(e?'?)和带隙($ E_g $)。还计算了体积模量($ B_0 $),减小的体积模量($ B'_0 $)和泊松比($ vee $)。这些参数的计算值与可用的实验值和报告值完全一致。

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