首页> 外文期刊>Plasma and Fusion Research >Back-Surface Temperature Measurements of Thin Tungsten Materials during Plasma-Gun Generated Pulsed Plasma Irradiation using a Fast Two-Color Pyrometer
【24h】

Back-Surface Temperature Measurements of Thin Tungsten Materials during Plasma-Gun Generated Pulsed Plasma Irradiation using a Fast Two-Color Pyrometer

机译:使用快速双色高温计在等离子枪产生的脉冲等离子辐照过程中测量薄钨材料的背面温度

获取原文
       

摘要

A fast two-color pyrometer system was developed to measure the back-surface temperature of thin tungsten materials during plasma-gun generated edge localized mode-like pulsed plasma irradiation. The developed pyrometer system had a time resolution of ~5 μs and the lowest measureable temperature was ~1600 K. We observed that the back-surface temperature of the thin tungsten material during the pulsed plasma irradiation reached ~3280 K. The absorbed energy density and the pulse width of the pulsed heat load estimated by the measured time evolution of the back-surface temperature and 3D heat analyses using ANSYS code were ~0.52 MJm?2 and ~1.6 ms, respectively.
机译:开发了一种快速的双色高温计系统,用于在等离子枪产生的边缘局限模式样脉冲等离子辐射过程中测量薄钨材料的背面温度。研制的高温计系统的时间分辨率为〜5μs,最低可测温度为〜1600K。我们观察到,脉冲等离子体辐照过程中薄钨材料的背面温度达到〜3280K。吸收的能量密度和通过测量背面温度的时间演变和使用ANSYS代码进行3D热分析所估算的脉冲热负荷的脉冲宽度分别为〜0.52 MJm ?2 和〜1.6 ms。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号